As usual, our SIOS experts have prepared both theoretical information and practical application examples for you.
Starting with a description of typical influences and contributions to measurement uncertainty we will, among other things, talk about:
- comparisons between different device principles of tactile thickness measurement,
- the interferometric tactile gauging-probe LM 20 and LM 50 from SIOS and their advantages over other high-precision gauges,
- applications for high-precision thickness measurements such as the SIOS Gauge-block calibration system EPP (the lens and wafer thickness measuring station will be shown) as well as
- possibilities of upgrading existing length and thickness measurement setups with interferometers.
At the end, our speakers will answer questions from the live webinar chat.
Speakers: Wolfram Meyer // Michael Kühnel, Project Manager R&D
Recording date: March 08, 2022
Time: 50 min