On September 24th, SIOS Meßtechnik GmbH once again hosted a practical seminar on simultaneous length and angle measurement. Under the expert guidance of the speakers Dr. Denis Dontsov and Falko Seyfferth, the participants were given a detailed insight into the theoretical principles of high-precision length and angle measurement with interferometers. The focus of the seminar was on Abbe error compensation, which helps to increase measurement accuracy.
In addition to the core topics, this time the topics of vibration measurement with laser interferometers and measurement errors in the alignment of laser interferometers using optical position sensors were intensively discussed, based on questions from the practical seminar in June 20, 2024. This special content gave the participants additional insight into the extended application of SIOS technologies and was met with great interest.
The topic of vibration measurement with laser interferometers was illustrated with concrete application examples. Participants were given a detailed insight into the identification of vibration patterns and discussed the practical application of this technology.
For the alignment of laser interferometers on the short measurement axes, Falko Seyfferth explained the use of in-house optical sensors with the aim of achieving relative measurement deviations of less than 1e-7. The use of different measurement reflectors and the importance of beam expansion to optimize measurement accuracy were also discussed.
On the subject of alignment of laser interferometers on short measurement axes, Falko Seyfferth explained the use of integrated optical sensors with the aim of achieving relative measurement deviations of less than 1e-7. The use of different measurement reflectors and the importance of beam expansion for optimizing measurement accuracy were discussed.
In the practical part of the seminar, which was led by Falko Seyfferth and Enrico Langlotz, the participants were able to see the SP 15000 C6 NG calibration interferometer for measurements up to 6 DoF and the SP 5000 TR triple beam interferometer at close range. The latter was of particular interest as it is already being used successfully by two of the customers present. The intensive discussion of possible error patterns and their effects on the measurement results provided a lot of material for discussion.
The participants asked numerous questions, which were answered in detail by the speakers. By the end of the seminar, all outstanding issues had been resolved.
"I am pleased to see how much interest there is in our high-precision measurement systems and their application in practice," said Dr. Denis Dontsov, Managing Director of SIOS Meßtechnik GmbH. "Our goal with these seminars is not only to provide our customers with the necessary expertise, but also to help them realize the full potential of our technologies.
Many thanks to all participants and speakers for the lively exchange and exciting discussions!
You can see impressions of the hands-on seminar in the picture gallery.
